au.\*:("RANGHIASCI C")
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ELECTRIC-FIELD-MODULATED REFLECTANCE OF THE BAND-GAP EXCITON REGION OF GATE.BURATTINI E; GRANDOLFO M; RANGHIASCI C et al.1975; PHYS. REV., B; U.S.A.; DA. 1975; VOL. 12; NO 2; PP. 664-668; BIBL. 16 REF.Article
LASER-MODULATED REFLECTANCE OF SBSI NEAR TC.EFENDIEV SM; GRANDOLFO M; RANGHIASCI C et al.1978; SOLID STATE COMMUNIC.; GBR; DA. 1978; VOL. 26; NO 4; PP. 251-253; BIBL. 9 REF.Article
PHOTOMETRIC LINEARITY TEST FOR IR SPECTROPHOTOMETERS BY MEANS OF A ROTATING SECTOR DISK ATTENUATORCAPPUCCIO G; D'AMICO A; D'ANGELO S et al.1982; APPL. OPT.; ISSN 0003-6935; USA; DA. 1982; VOL. 21; NO 20; PP. 3619-3622; BIBL. 5 REF.Article
THERMOREFLECTANCE SPECTRA OF RF-SPUTTERED EPITAXIAL SINGLE-CRYSTAL FILMS OF PBXSN1-XTE.CAPPUCCIO G; CORSI C; GIANSANTELLI A et al.1977; PHYS. REV., B; U.S.A.; DA. 1977; VOL. 15; NO 8; PP. 3986-3993; BIBL. 33 REF.Article